scanning magnetic-force microscope

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• Magnetic force microscope — MFM images of 3.2 GB and 30 GB computer hard drive surfaces. Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip sample magnetic interactions are detected and used …   Wikipedia

• Scanning Hall probe microscope — The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a… …   Wikipedia

• Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia

• Magnetic resonance force microscopy — (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X ray crystallography …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Microscope — This article is about microscopes in general. For light microscopes, see optical microscope. Microscope Us …   Wikipedia

• Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface …   Wikipedia

• microscope — /muy kreuh skohp /, n. 1. an optical instrument having a magnifying lens or a combination of lenses for inspecting objects too small to be seen or too small to be seen distinctly and in detail by the unaided eye. 2. (cap.) Astron. the… …   Universalium

• Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… …   Wikipedia

• Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… …   Wikipedia